Field Emission Scanning Electron Microscope
1. Manufacturer and model: JEOL-JSM-7800F
2. Test Content: Microscopic morphology, structure of the solid sample, elemental composition and line distribution, surface distribution, etc. (Equipped with Energy Dispersive X-ray Spectrometer)
3. Vacuum degree: Electron gun chamber high vacuum 10-7 Pa; Provide UPS for ion pump; Delay more than 200 hours; Sample chamber vacuum 10-4 Pa
4. The pump system: Magnetic suspension turbomolecular pump, two ion pumps and one mechanical pump
5. Electron gun: High stability immersion Schottky thermal field emission electron source, can automatically adjust the axis
6. Technical indicators: Resolution: 0.8 nm (15 kV) 1.2 nm (1 kV); Magnification: 25~1,000,000x; Accelerating Voltage: 0.01~30 kV; Probe current: 200 nA (15 kV); Objective lens design: High resolution observation using the Super Hybrid Lens; Specimen stage: 5-axis motor drive stage
Test leader: Xuehua Liu
Email: liuxuehua@qdu.edu.cn